NIT SenS 1920 Full HD SWIR Camera

SenS 1920 2 Megapixel InGaAs SWIR Camera

The SenS 1920 is a high-resolution InGaAs SWIR camera designed for semiconductor inspection, wafer and solar cell inspection, microscopy, machine vision, defense and security imaging, laser-related imaging, and scientific research. The camera combines a 1920 × 1080 Full HD sensor format, 8 µm pixel pitch, 900-1700 nm SWIR response, low read noise, and multiple interface options for laboratory, machine vision, and OEM integration.

Request SenS 1920 Quote →
Compare SWIR Cameras →
View Specifications →
Available Models →

Full HD 2 MP InGaAs SWIR camera for high-resolution inspection and demanding imaging applications.

Full HD SWIR Imaging

The SenS 1920 provides a 1920 × 1080 sensor format for applications requiring more field coverage, finer spatial detail, and improved inspection capability compared with VGA-format SWIR cameras.

Low-Noise InGaAs Sensor

The camera uses NIT’s in-house designed NSC2101 InGaAs focal plane array with high sensitivity and typical read-out noise around 25 electrons for demanding SWIR imaging tasks.

Multiple Interfaces

SenS 1920 configurations are available with USB3.0, Camera Link, HD-SDI, and CoaXPress interface options, supporting laboratory imaging, machine vision, and OEM integration workflows.

SenS 1920 Overview

The SenS 1920 SWIR camera delivers high image definition and low-noise performance for applications that need both detailed spatial resolution and high-quality short-wave infrared image data. Its Full HD 1920 × 1080 format is useful for semiconductor inspection, wafer inspection, solar cell panel inspection, microscopy, machine vision, surveillance, and research imaging where VGA SWIR resolution is not sufficient.

The camera operates over the 900-1700 nm SWIR wavelength range and uses an 8 µm pixel pitch InGaAs sensor. The high-resolution format provides a wider field of view or more inspection detail depending on the selected lens, working distance, and system geometry.

1920 × 1080 Full HD SWIR resolution
2 megapixel InGaAs sensor format
8 µm pixel pitch
900-1700 nm short-wave infrared response
Typical read-out noise around 25 e-
Dynamic range approximately 64 dB
Full-frame frame rate greater than 40 Hz; higher rates possible with sub-windowing
USB3.0, Camera Link, HD-SDI, and CoaXPress interface options
GenICam-compatible integration options depending on configuration
NITVision GUI and SDK support for USB configurations

Quick Links

Available SenS 1920 Models

The SenS 1920 family can be configured with different data interface options depending on the system architecture. Pembroke Instruments can help confirm the right interface, cable, frame grabber, software, and integration approach.

Model	Interface	Typical Use	Notes
SenS 1920V-ST	USB 3.0	Laboratory imaging, R&D, microscope imaging, and PC-based acquisition	Good choice when direct USB acquisition and NITVision / SDK workflow are preferred.
SenS 1920M-ST	Camera Link SDR26	Frame-grabber machine vision, instruments, and OEM integration	Useful for deterministic acquisition and Camera Link system architectures.
SenS 1920L-ST	Camera Link-LSHM130	High-performance Camera Link integration	Use where the LSHM130 Camera Link connector format is required.
SenS 1920H-ST	HD-SDI	Video-based monitoring and display workflows	Appropriate when an HD-SDI video output workflow is preferred.
SenS 1920C-ST	CoaXPress	High-bandwidth machine vision and OEM systems	Appropriate for CoaXPress-based acquisition architectures.

Confirm Best SenS 1920 Model →
Review Software Options →

SenS 1920 Technical Specifications

Camera family	SenS 1920
Sensor	NSC2101T-SI
Detector material	InGaAs
Resolution	1920 × 1080 pixels, approximately 2 megapixels
Pixel pitch	8 µm
Spectral response	0.9 to 1.7 µm / 900-1700 nm
Response modes	Linear CTIA low gain and high gain
Operating modes	ITR, CDS, ROI
Quantum efficiency	>80% in low-gain mode
Read-out noise	Typical 25 e-
Dynamic range	Approximately 64 dB
Frame rate	>40 Hz full frame in legacy page summary; specifications table lists >60 Hz full frame
Partial reading mode	ROI and selective line scanning
Interface options	USB3.0, Camera Link, HD-SDI, and CoaXPress configurations
Software	NITVision GUI
SDKs for USB	x86-64 and Arm64; C++, C#, and Python support
Dimensions	58 × 58 × 70 mm
Weight	<400 g
Lens mount	Native C-mount

Note: The legacy page lists both >40 Hz and >60 Hz full-frame frame rate statements. This rebuilt page preserves both references in the specifications note so the final value can be confirmed against the most current NIT datasheet if needed.

Why Choose the SenS 1920?

Higher Resolution Inspection

Full HD SWIR imaging helps inspect larger areas, capture more detail, or reduce the number of camera positions compared with lower-resolution SWIR cameras.

Low-Noise SWIR Imaging

The NIT-designed InGaAs sensor provides high sensitivity and low read noise for demanding applications that require quality image data.

Flexible Integration

Multiple interface options allow the same camera family to support laboratory, machine vision, frame-grabber, video, and OEM architectures.

Software, SDK, and Interface Options

Pembroke Instruments can help match the SenS 1920 interface and software workflow to the application. USB3.0 configurations are often selected for PC-based acquisition, laboratory imaging, microscope imaging, and R&D. Camera Link and CoaXPress configurations are used when frame grabbers, deterministic machine-vision acquisition, or OEM integration requirements are important. HD-SDI configurations are useful when video display or monitoring workflows are required.

Interface	Typical Use	Software / Integration Notes
USB 3.0	Laboratory imaging, microscopy, R&D, and PC-based acquisition	NITVision GUI and SDK support for x86-64 and Arm64, including C++, C#, and Python support.
Camera Link	Frame-grabber integration, machine vision, instruments, and OEM systems	Use when Camera Link acquisition hardware and integration workflow are preferred.
HD-SDI	Video monitoring and display workflows	Useful when direct video-style output is required.
CoaXPress	High-bandwidth machine vision and OEM integration	Use for CoaXPress acquisition architectures and high-performance machine vision systems.

Need Integration Help?

Ask about interface selection, frame grabber cards, data cables, SDK support, GenICam workflows, microscope coupling, SWIR lenses, illumination, triggering, and application-specific setup.

Contact Pembroke →

Typical SenS 1920 Applications

SWIR Camera Applications

Review common SWIR applications including semiconductor inspection, materials analysis, laser viewing, moisture contrast, and R&D imaging.

SWIR Microscopy

Use Full HD SWIR imaging with microscope optics for wafer, MEMS, semiconductor, biological, and materials research.

SWIR Optics and Design

Learn how lens selection, working distance, field of view, filters, illumination, and optical alignment affect SWIR performance.

Application Engineering with SWIR

Learn how illumination, optics, exposure, calibration, and processing affect SWIR system performance.

Related SWIR Cameras and Resources

Need Help Selecting a High-Resolution SWIR Camera?

Contact Pembroke Instruments to discuss sensor resolution, field of view, lens selection, interface type, software workflow, frame grabber requirements, SWIR illumination, microscope coupling, and application-specific integration requirements for the SenS 1920 camera.

Request Quote / Technical Support →
Return to SWIR Camera Selection →

SWIR Imaging Request

Send us your application details and Pembroke Instruments will help identify the appropriate SWIR camera, optics, accessories, and software configuration.

SWIR Imaging Request

Send in your requests for informaation