Scientific Optical Spectrometers for VUV, UV, XUV, EUV, and X-Ray Applications
Scientific optical spectrometers are used to measure light intensity and spectral composition across VUV, UV, XUV, EUV, and X-ray wavelength regions. Pembroke Instruments supplies high-performance spectrometers for laboratory research, industrial process monitoring, light-source characterization, materials analysis, plasma diagnostics, and advanced spectroscopy applications.
Use this page to compare compact VUV spectrometers, flat-field XUV spectrometers, high-resolution XUV spectrometers, monochromator options, and X-ray absorption spectroscopy systems. For compact UV-VIS-NIR spectroscopy, visit the Avenir compact spectrometers page. For use-case guidance, see high-energy spectrometer applications.
Pembroke Instruments helps engineers and researchers select the right spectrometer by matching spectral range, source geometry, light collection efficiency, detector format, vacuum requirements, control interface, and customization needs to the application.
VUV Spectroscopy
For measurements in the 80-300 nm region, including compact spectrograph and monochromator configurations.
maxLIGHT-pro-XUV is a high-efficiency flat-field XUV spectrometer and beam profiler designed for maximum light collection and high system efficiency. It combines a spectrometer and integrated beam profiler, making it a complete characterization tool for XUV source development and advanced laboratory spectroscopy.
The platform supports wide flat-field spectral coverage from approximately 1-200 nm with automated switching of spectral regions.
Compare XUV and VUV spectrometers by wavelength range, optical architecture, resolution and intended application. This product-first layout gives each instrument a larger visual presentation and highlights the measurement problem it is designed to solve.
Quick selection:
Maximum XUV light collection: maxLIGHT pro
Compact broadband XUV measurements: easyLIGHT XUV
Highest XUV spectral resolution: highLIGHT
In-line beamline characterization: beamLIGHT
Compact spectrometer + beam profiler: nanoLIGHT
80–300 nm VUV spectroscopy: easyLIGHT VUV
High-Efficiency XUV Spectrometer + Beam Profiler
maxLIGHT pro
1–200 nm
Designed for maximum light collection and complete characterization of XUV sources. The flat-field grazing-incidence platform uses direct source imaging and a high-efficiency no-slit architecture. An integrated beam profiler allows spectral output and beam characteristics to be evaluated with one platform.
Flat-field grazing-incidence spectrometer
High-efficiency no-slit design
Integrated beam profiler
Motorized grating positioning and modular configuration
For HHG, attosecond science, plasma sources, FELs and XUV source development
A compact flat-field normal-incidence spectrometer for efficient broadband XUV and VUV measurements. Its no-slit configuration directly images the radiation source, improving light collection while simplifying alignment for laboratory source characterization.
30–250 nm broadband coverage
Compact normal-incidence design
No-slit mode for high collection efficiency
Integrated stray-light suppression
For HHG, plasma diagnostics and broadband source qualification
The high-resolution platform for experiments requiring fine spectral discrimination. highLIGHT combines flat-field grazing-incidence optics with wide single-shot coverage and can operate in either high-efficiency no-slit mode or conventional entrance-slit mode.
Flat-field grazing-incidence architecture
Resolution approximately 0.006 nm or better, configuration dependent
Wide single-shot wavelength coverage
No-slit and entrance-slit modes
For narrow spectral features and precision XUV spectroscopy
beamLIGHTIn-line XUV spectrometer Insert beamLIGHT image from the High Energy Applications page / Media Library.
In-Line XUV Spectrometer
beamLIGHT
Beamline-integrated XUV spectroscopy
Built for in-situ spectral characterization in a beamline. beamLIGHT combines a compact no-slit spectrometer with automated beam bypass, making it useful for routine source monitoring where space, alignment stability and remote operation are important.
In-situ measurement with beam bypass
Compact footprint for tight beamline installations
Automated remote operation
Standard and ultra-high-vacuum configurations
Optional beam profiling and additional diagnostics
nanoLIGHTIntegrated XUV spectrometer + beam profiler Insert nanoLIGHT image from the High Energy Applications page / Media Library.
Compact Integrated XUV Characterization
nanoLIGHT
10–80 nm
A compact instrument combining XUV spectroscopy and beam profiling for periodic in-situ characterization. Fast automated switching and full beam bypass make nanoLIGHT particularly useful for retrofit and space-constrained beamline installations.
A versatile compact VUV spectrometer with optional monochromator operation. High grating efficiency, closed-loop grating positioning and integrated stray-light suppression support accurate source characterization and wavelength-selective laboratory measurements.
A complete characterization platform for VUV sources, combining a high-efficiency flat-field spectrometer with beam profiling. Automated spectral-region switching and extension options toward shorter XUV wavelengths provide flexibility for evolving laboratory requirements.
High-efficiency flat-field VUV spectroscopy
Integrated beam profiler
Automated spectral-region switching
Extension flexibility toward XUV wavelengths
For VUV source characterization and plasma diagnostics
Integrated X-ray absorption spectroscopy systems for near-edge and extended absorption-edge measurements. These systems support NEXAFS and materials studies where chemical state, local atomic environment and oxidation-state information are important.
Need help choosing? Send Pembroke Instruments your wavelength or photon-energy range, source type, expected signal level, resolution target, vacuum requirements and detector preferences. We can help identify the most appropriate spectrometer architecture and configuration.
Featured Spectrometers
maxLIGHT-pro-XUV
High-efficiency no-slit flat-field XUV spectrometer and beam profiler for source characterization and advanced laboratory spectroscopy.
The maxLIGHT pro combines high-performance flat-field spectrometer functionality with a beam profiler. Automated switching between spectrograph and profiler modes supports routine verification of beam properties. The system covers approximately 1-200 nm using aberration-corrected flat-field optics and multiple grating ranges.
The easyLIGHT XUV spectrograph provides aberration-corrected wavelength coverage in the extreme and vacuum ultraviolet regions. The high-efficiency flat-field grating supports wide-band spectral measurements covering approximately 30-200 nm, and the no-slit configuration can maximize light collection.
The easyLIGHT VUV spectrograph provides spectrograph and monochromator functionality in the vacuum ultraviolet region. High-efficiency gratings and closed-loop positioning provide accurate wavelength selection, with manual or optional motorized slit control.
Integrated XAS systems support near-edge and extended absorption-edge measurements. NEXAFS can be used to evaluate variations in X-ray absorption coefficient, chemical state, local atomic environment, and oxidation-state related information.
High-performance VUV, XUV, EUV, and X-ray spectrometers support source qualification, spectroscopy research, absorption-edge analysis, and detector-based experiments. The examples below preserve the application imagery and supporting publication links from the original page.
NEXAFS Spectroscopy
Near-edge X-ray absorption fine structure spectroscopy for studying electronic states and absorption-edge structure.
These related pages help engineers connect spectrometer selection with the broader measurement system, including compact spectrometers, high-energy spectroscopy applications, scientific cameras, and hyperspectral imaging.
Compact UV-VIS-NIR Spectrometers
For compact UV, visible, and NIR spectroscopy systems, including Avenir spectrometer solutions.
Talk to Pembroke About Your Spectrometer Application
Choosing a spectrometer for VUV, XUV, EUV, or X-ray work often depends on source geometry, wavelength range, vacuum compatibility, detector selection, and required signal-to-noise performance. Pembroke Instruments can help compare standard platforms or request a customized configuration.
