SenS 1920 SWIR Camera
2 megapixel InGaAs SWIR camera for high-resolution semiconductor inspection, material analysis, microscopy, and machine vision.
View SenS 1920 SWIR Camera ->SWIR cameras, also called shortwave infrared cameras or InGaAs cameras, capture image information beyond the visible spectrum. Pembroke Instruments supplies high-performance SWIR camera systems spanning approximately 450 to 3000 nm for semiconductor inspection, machine vision, laser beam profiling, spectroscopy, microscopy, material sorting, and scientific research.
Use this page to compare 2 megapixel SWIR cameras, 1.3 MP SWIR cameras, VGA SWIR cameras, high-speed qVGA SWIR cameras, deeply cooled SWIR cameras, and line-scan SWIR cameras. For application examples, see the SWIR camera applications guide or contact Pembroke for camera, lens, illumination, and software selection support.
Pembroke Instruments helps engineers and researchers select the right SWIR camera by matching the sensor format, wavelength range, cooling level, interface, optics, and software workflow to the actual measurement task. This layout is designed so users can quickly narrow the camera family before requesting a quote or technical review.
Choose 2 MP or 1.3 MP SWIR cameras for semiconductor inspection, microscopy, and spatially detailed machine vision.
View high-resolution cameras ->Choose TE-cooled or deeply cooled SWIR cameras for low-light imaging, spectroscopy-related work, and longer exposures.
View cooled cameras ->Choose qVGA or high-speed VGA SWIR cameras for dynamic processes, laser events, and fast inspection tasks.
View high-speed cameras ->Compare USB3, GigE Vision, Camera Link, CoaXPress, HD-SDI, and analog output options for your system architecture.
Talk to Pembroke ->Jump directly to the SWIR camera class that best matches your application. These internal anchors help users and search engines understand the page structure while making the page easier to navigate.
Compare camera interface, sensor format, cooling, wavelength range, and frame rate. Use these rows as a selection starting point; Pembroke Instruments can help verify optics, field of view, illumination, triggering, and software requirements.
| Camera Model | Image | Spectral Range | Interface | Sensor Format | Cooling | Max Frame Rate | Best Fit |
|---|---|---|---|---|---|---|---|
| eZephir / Zephir 2.5e | ![]() |
900-2500 nm | USB 3.0 / Camera Link | 640 x 512 px / 15 µm | Deep TE cooled | 240 fps | Extended SWIR, low-noise imaging, spectroscopy, astronomy, and demanding scientific applications |
| ALIZE 1.7 | ![]() |
900-1700 nm | USB 3.0 / Camera Link | 640 x 512 px / 15 µm | TE cooled | 250 fps | Low-noise SWIR imaging for research and industrial inspection |
| Zephir 1.7 | ![]() |
900-1700 nm | USB 3.0 / Camera Link | 640 x 512 px / 15 µm | TE cooled | 240 fps | Cooled InGaAs imaging where sensitivity and stability are critical |
Compare camera interface, sensor format, cooling, wavelength range, and frame rate. Use these rows as a selection starting point; Pembroke Instruments can help verify optics, field of view, illumination, triggering, and software requirements.
| Camera Model | Image | Spectral Range | Interface | Sensor Format | Cooling | Max Frame Rate | Best Fit |
|---|---|---|---|---|---|---|---|
| SenS 1920M-ST | ![]() |
900-1700 nm | Camera Link | 1920 x 1080 px / 8 µm | TE cooled | 40 fps | High-resolution semiconductor inspection, microscopy, and machine vision |
| SenS 1920L-ST | ![]() |
900-1700 nm | Camera Link | 1920 x 1080 px / 8 µm | TE cooled | 40 fps | High-resolution SWIR imaging with Camera Link integration |
| SenS 1920V-ST | ![]() |
900-1700 nm | USB 3.0 | 1920 x 1080 px / 8 µm | TE cooled | 40 fps | USB3 2MP SWIR camera for engineering and laboratory workflows |
Compare camera interface, sensor format, cooling, wavelength range, and frame rate. Use these rows as a selection starting point; Pembroke Instruments can help verify optics, field of view, illumination, triggering, and software requirements.
| Camera Model | Image | Spectral Range | Interface | Sensor Format | Cooling | Max Frame Rate | Best Fit |
|---|---|---|---|---|---|---|---|
| SenS 1280V-ST | ![]() |
900-1700 nm | USB 3.0 | 1280 x 1024 px / 10 µm | TE cooled | 60 fps | Balanced resolution and speed for industrial inspection |
| SenS 1280M-ST | ![]() |
900-1700 nm | Camera Link | 1280 x 1024 px / 10 µm | TE cooled | 60 fps | Machine vision and OEM integration |
| SenS 1280C-STE | ![]() |
900-1700 nm | CoaXPress | 1280 x 1024 px / 10 µm | TE cooled | 60 fps | CoaXPress integration for industrial imaging |
| SenS 1280H-STE | ![]() |
900-1700 nm | HD-SDI | 1280 x 1024 px / 10 µm | TE cooled | 60 fps | HD-SDI output for video-oriented SWIR setups |
Compare camera interface, sensor format, cooling, wavelength range, and frame rate. Use these rows as a selection starting point; Pembroke Instruments can help verify optics, field of view, illumination, triggering, and software requirements.
| Camera Model | Image | Spectral Range | Interface | Sensor Format | Cooling | Max Frame Rate | Best Fit |
|---|---|---|---|---|---|---|---|
| WiDy SWIR 640V-S | ![]() |
900-1700 nm | USB 3.0 | 640 x 512 px / 15 µm | Uncooled | 100 fps | Cost-effective uncooled SWIR camera for machine vision |
| WiDy SWIR 640G-SE | ![]() |
900-1700 nm | GigE Vision / PoE | 640 x 512 px / 15 µm | Uncooled | 100 fps | GigE Vision SWIR camera for industrial integration |
| WiDy SenS 640V-ST | ![]() |
900-1700 nm | USB 3.0 | 640 x 512 px / 15 µm | TE cooled | 250 fps | High-sensitivity cooled VGA SWIR imaging |
| WiDy SenS 640M-ST | ![]() |
900-1700 nm | Camera Link | 640 x 512 px / 15 µm | TE cooled | 250 fps | Camera Link SWIR camera for machine vision |
| WiDy SenS 640G-STE | ![]() |
900-1700 nm | GigE Vision / PoE | 640 x 512 px / 15 µm | TE cooled | 250 fps | GigE Vision cooled SWIR camera |
| HiPe SenS 640V-ST | ![]() |
900-1800 nm | USB 3.0 | 640 x 512 px / 15 µm | TE cooled | 250 fps | Extended 1800 nm response for specialized SWIR imaging |
Compare camera interface, sensor format, cooling, wavelength range, and frame rate. Use these rows as a selection starting point; Pembroke Instruments can help verify optics, field of view, illumination, triggering, and software requirements.
| Camera Model | Image | Spectral Range | Interface | Sensor Format | Cooling | Max Frame Rate | Best Fit |
|---|---|---|---|---|---|---|---|
| WiDy SenS 320V-ST | ![]() |
900-1700 nm | USB 3.0 | 320 x 256 px / 15 µm | TE cooled | 1,000 fps | High-speed SWIR imaging for dynamic events |
| WiDy SenS 320V-ST-HS | ![]() |
900-1700 nm | USB 3.0 | 320 x 256 px / 15 µm | TE cooled | 10,000 fps | Very high-speed SWIR imaging |
| WiDy SenS 320G-STE2 | ![]() |
900-1700 nm | GigE Vision / PoE | 320 x 256 px / 15 µm | TE cooled | 1,000 fps | Networked high-speed SWIR imaging |
Compare camera interface, sensor format, cooling, wavelength range, and frame rate. Use these rows as a selection starting point; Pembroke Instruments can help verify optics, field of view, illumination, triggering, and software requirements.
| Camera Model | Image | Spectral Range | Interface | Sensor Format | Cooling | Max Frame Rate | Best Fit |
|---|---|---|---|---|---|---|---|
| LiSA | ![]() |
900-1700 nm | Camera Link | 2048 x 1 px / 7.5 µm | TE cooled | 60 kHz | Line-scan SWIR inspection for continuous processes |
These representative SWIR camera families cover common engineering requirements from high-resolution InGaAs imaging to deeply cooled extended-SWIR measurements. Keep this section above or near the comparison table so visitors can quickly understand the major product families before reviewing detailed specifications.
2 megapixel InGaAs SWIR camera for high-resolution semiconductor inspection, material analysis, microscopy, and machine vision.
View SenS 1920 SWIR Camera ->
1.3 megapixel SWIR camera for industrial inspection, moisture detection, process monitoring, and research imaging.
View SenS 1280 SWIR Camera ->
VGA SWIR camera family with cooled and interface-specific configurations for engineering and OEM integration.
View SenS 640 SWIR Camera ->
Deeply cooled extended-SWIR camera for low-light imaging, spectroscopy, astronomy, and scientific measurement.
View Zephir 2.5e SWIR Camera ->SWIR imaging is valuable when visible cameras cannot provide enough contrast, transmission, or wavelength-specific information. The dedicated applications page should carry the heavier application content, while this product page should summarize the most important uses and route visitors to deeper pages.
Inspect silicon wafers, dies, bonded devices, and packages using SWIR wavelengths that can reveal features invisible to visible cameras.
Learn more ->Image and align NIR/SWIR lasers used in research, manufacturing, medical systems, defense, and optical engineering.
Learn more ->Improve contrast for sorting, contamination detection, plastic inspection, coating checks, and industrial quality control.
Learn more ->Detect water content, wet/dry differences, coating variation, and material composition changes that standard cameras often miss.
Learn more ->Support microscopy, spectroscopy-related imaging, material science, photonics, low-light imaging, and laboratory experiments.
Learn more ->Move from broadband SWIR imaging to spectral imaging when material identification or chemical mapping is required.
Learn more ->Selecting and integrating a SWIR camera requires understanding detector physics, optical design, wavelength response, illumination, calibration, and image processing. Pembroke Instruments provides technical guides to help engineers and researchers evaluate InGaAs SWIR imaging systems and plan successful camera integrations.
Review how shortwave infrared light interacts with materials, why silicon becomes more transparent in SWIR wavelengths, and how InGaAs sensors capture information that visible cameras cannot see.
Explore practical SWIR imaging applications including semiconductor inspection, laser beam profiling, moisture detection, sorting, machine vision, scientific imaging, and materials analysis.
Learn about lens selection, SWIR coatings, working distance, field of view, illumination geometry, filters, and other optical design factors that affect SWIR camera performance.
Find guidance for camera integration, calibration workflow, triggering, software, image correction, and processing considerations for industrial and laboratory SWIR imaging systems.
These SWIR resources are intended to help define camera requirements, compare camera options, and support deployment in research, machine vision, semiconductor, laser, and industrial inspection applications.
Pembroke Instruments provides pre-sales and post-sales technical support for SWIR camera selection, lens matching, field-of-view planning, lighting, software, SDK integration, and system configuration. Share your wavelength range, field of view, working distance, target size, speed requirement, and interface preference so we can recommend the best-fit SWIR imaging system.