Advanced Imaging and Spectroscopy Systems

SWIR Cameras, Thermal Imaging Systems, and Spectrometers for Industrial, Scientific, and Engineering Applications

Pembroke Instruments supplies high-performance SWIR cameras, thermal imaging systems, and spectrometers for semiconductor inspection, machine vision, electronics testing, process monitoring, materials research, spectroscopy, and advanced engineering applications.

Primary Product Category

SWIR Cameras and InGaAs Imaging Systems

SenS 1920 SWIR camera

SenS 1920

2 MP InGaAs SWIR camera for high-resolution semiconductor inspection and machine vision.

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SenS 1280 SWIR camera

SenS 1280

1.3 MP SWIR camera family for industrial inspection, research, and OEM integration.

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SenS 640 SWIR camera

SenS 640

VGA SWIR camera configurations for high-sensitivity imaging and integration workflows.

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Primary Product Category

Thermal Imaging Systems and LWIR Cameras

IRSX-I640 fixed-mount industrial thermal camera

IRSX-I640

Higher-resolution IRSX thermal camera for automated temperature monitoring and process inspection.

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IRSX-I336 compact industrial thermal camera

IRSX-I336

Compact smart thermal imaging platform for industrial inspection and monitoring.

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Thermal microscope for electronics and semiconductor temperature mapping

Thermal Microscopy

Microscope-based thermal imaging for electronics, PCB, semiconductor, and materials analysis.

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Thermal microscope resolution and thermal optics example

Thermal Optics

Lens, working-distance, field-of-view, calibration, and integration guidance for LWIR systems.

Thermal optics guide →
Important Product Category

Spectrometers for UV-VIS, NIR, VUV, XUV, and X-ray Applications

ARIS UV-VIS compact spectrometer

ARIS UV-VIS

Compact UV-VIS spectrometers for absorbance, transmission, process monitoring, and OEM integration.

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SIENA miniature NIR spectrometer

SIENA NIR

Miniature NIR spectrometers for material identification, moisture analysis, and process sensing.

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maxLIGHT-pro high-energy XUV spectrometer and beam profiler

maxLIGHT-pro

High-energy VUV/XUV spectrometer and beam profiler for source characterization, plasma diagnostics, EUV research, and advanced laboratory spectroscopy.

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Applications for SWIR, Thermal Imaging, and Spectroscopy

Route visitors from the homepage into application pages that support buyer intent and topical authority. These links reinforce the relationship between product families, engineering use cases, and technical resources.

Semiconductor and Electronics Inspection

Use SWIR for through-silicon and backside imaging, thermal imaging for powered-device hot-spot detection, and spectroscopy for materials and process characterization.

SWIR semiconductor guide →
Thermal microscopy →

Technical Resources for Product Selection and Integration

These internal links help engineers move from basic research to product selection while strengthening topical authority around SWIR cameras, thermal imaging systems, and spectrometers.

Work with Pembroke Instruments

Pembroke Instruments helps engineers, researchers, and system integrators select and configure SWIR cameras, thermal imaging systems, spectrometers, optics, lighting, software, and accessories for demanding imaging and spectroscopy applications.