PCB & Electronics
Locate hot spots, short circuits, leakage paths and abnormal component heating during powered testing.
Discuss this application →Microscopic temperature measurement • Industrial and research
Reveal hot spots, leakage paths, power dissipation and thermal gradients that ordinary optical microscopes cannot show. Investigate PCB assemblies, semiconductors, solar cells and advanced materials with non-contact, radiometric LWIR imaging.

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More than a camera: an integrated measurement platform that can be configured for the working distance, field of view and detail your application requires.

Applications that benefit from thermal microscopy
Use spatially resolved temperature information to narrow the search for defects, compare operating conditions and accelerate development.
Locate hot spots, short circuits, leakage paths and abnormal component heating during powered testing.
Discuss this application →Examine localized heat generation in ICs, packages, interconnects and semiconductor devices.
Discuss this application →Investigate hot spots, shunts and uneven temperature distribution in photovoltaic devices.
Discuss this application →Study heating in cells, connectors, power devices and thermal management assemblies.
Discuss this application →Map thermal gradients in films, coatings, composites and small experimental samples.
Discuss this application →Evaluate absorption-induced heating and thermal behavior in optoelectronic assemblies.
Discuss this application →Real inspection detail
Thermal microscopy helps identify heat patterns across components, traces, packages and localized defect regions. Examine the response during power-up, load changes and comparative tests.
Spatial detail depends on the optics, working distance, measurement conditions and sample. The approximately 20 µm value is an example configuration, not a universal limit.
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Technical capabilities
| Parameter | Typical capability / configuration |
|---|---|
| Detector | LWIR thermal imaging, 640 × 512 pixels |
| Spatial resolution | Approximately 20 µm for example IC/PCB setups; optics- and geometry-dependent |
| Optics | 50 mm macro lens; optional microscope objectives |
| Temperature range | −20°C to +550°C |
| Data | Full radiometric video and temperature trends |
| Integration | Optional temperature, voltage and current synchronization |
| Mechanical system | Vertical mount, translation stage and optical breadboard |
*Final performance depends on optics, working distance, sample properties, emissivity and measurement conditions.
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Describe what you need to inspect and the level of detail you need. Pembroke Instruments can help choose the camera, lens, stage and measurement software.
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