NIT SenS 1280 SXGA SWIR Camera

SenS 1280 1.3 Megapixel InGaAs SWIR Camera

SenS 1280 is a high-definition SWIR camera built around NIT's in-house designed NSC1901 InGaAs sensor. It combines 1280 × 1024 SXGA resolution, 10 µm pixels, 900-1700 nm spectral response, low read-out noise, and multiple interface options for semiconductor inspection, high-resolution microscopy, laser tracking, security and surveillance, scientific imaging, machine vision, and OEM integration.

SenS 1280 SWIR camera

SXGA 1.3 MP InGaAs SWIR camera for high-definition inspection, microscopy, and machine vision applications.

SenS 1280 Camera Highlights

The SenS 1280 is designed for applications that need more image detail than VGA SWIR cameras while keeping a compact, industrial camera form factor. The camera is available in Compact and Smart versions, giving engineers flexibility for laboratory imaging, OEM integration, and machine vision systems.

SXGA Resolution

1280 × 1024 pixels provide higher image detail and a larger field of view than VGA-format SWIR cameras.

10 µm Pixels

The 10 µm pixel pitch balances sensitivity, spatial resolution, and practical optical design for high-definition SWIR imaging.

Low Noise

Typical sensor noise is approximately 30e- in CTIA high-gain mode, supporting demanding low-noise SWIR imaging applications.

Flexible Interfaces

USB 3.0, Camera Link, HD-SDI, and CoaXPress configurations support laboratory, industrial, and OEM workflows.

High-Definition SWIR Imaging for Inspection, Microscopy, and OEM Systems

The SenS 1280 is a compact and affordable high-definition SWIR camera for applications that require higher spatial resolution than standard VGA SWIR cameras. The SXGA format and low noise floor make it useful for semiconductor wafer analysis, security and surveillance, laser tracking, high-resolution SWIR microscopy, industrial inspection, materials analysis, and laboratory imaging.

The camera is based on NIT's advanced NSC1901 InGaAs sensor. It delivers 900-1700 nm SWIR response, 60 Hz full-frame operation, ROI and selective line scanning modes, and 14-bit digitization.

  • 1280 × 1024 SXGA resolution
  • 10 µm pixel pitch
  • 900-1700 nm spectral response
  • InGaAs NSC1901 sensor
  • Greater than 80% QE in low-gain mode
  • 60 Hz full-frame operation
  • 10 µs to 500 ms exposure time
  • ROI and selective line scanning
  • C-mount native lens mount

Best Fit Applications

Use the SenS 1280 when the application needs higher image detail than VGA SWIR cameras but does not require the larger 2 MP format of the SenS 1920.

  • Semiconductor wafer and die inspection
  • Solar cell and photovoltaic inspection
  • High-resolution SWIR microscopy
  • Laser tracking and beam observation
  • Machine vision and industrial inspection
  • Security, surveillance, and research imaging
Ask an Engineer ->

SenS 1280 Compact and Smart Model Options

SenS 1280 cameras are available in Compact and Smart configurations. Compact versions support USB 3.0 and Camera Link workflows. Smart versions add on-board processing and GenICam-compliant integration through Camera Link, HD-SDI, and CoaXPress options.

VersionOutput OptionsKey FeaturesSoftware / IntegrationBest Fit
SenS 1280 Compact USB 3.0, Camera Link NUC and BPR, selective line scanning, multi ROI up to 8 vertically stacked blocks NITVision GUI; USB SDKs for x86-64 and Arm64 using C++, C#, and Python Laboratory imaging, microscopy, engineering development, and USB/Camera Link OEM integration
SenS 1280 Smart Camera Link, HD-SDI, CoaXPress On-board NUC and BPR, Automatic Gain Control, Automatic Integration Time, GenICam compliance NITGenicamControlTool and GenICam-compatible workflows Machine vision, embedded inspection, smart camera workflows, and systems needing real-time image optimization

SenS 1280 Technical Specifications

The specifications below summarize key information from the current SenS 1280 page source. Confirm final configuration details with Pembroke Instruments before ordering.

SpecificationSenS 1280 Value
SensorNSC1901T-SI
Sensor MaterialInGaAs
Resolution1280 × 1024 pixels
Pixel Pitch10 µm
Spectral Response0.9 to 1.7 µm / 900-1700 nm
Dual ResponseLinear CTIA low and high gain
ModesITR, CDS, ROI
Quantum Efficiency>80% in low-gain mode
Frame Rate60 Hz full frame
Partial Reading ModeROI and selective line scanning
Exposure Time10 µs to 500 ms
TriggerSoftware or hardware trigger; 1 trigger input/output; 2 programmable outputs; selectable delay
Power Range12 V
Dimensions58 × 58 × 70 mm for Compact; 58 × 58 × 64/72 mm for Smart
Weight<400 g
Lens MountC-mount native
ADC14 bits
Operating Temperature-40°C to +71°C

Operating Modes, Noise, Well Capacity, and Dynamic Range

The SenS 1280 supports CTIA high-gain and CTIA low-gain operating modes. High gain is typically used when sensitivity and low noise are most important. Low gain provides higher well capacity and dynamic range for brighter scenes.

Operating ModeTypical Sensor NoiseWell CapacityDynamic RangeUse Case
CTIA High Gaintyp. 30e->10Ke-52 dBLow-light imaging, sensitivity-driven measurements, microscopy, and inspection tasks requiring low read noise
CTIA Low Gaintyp. 120e->130Ke-61 dBBright scenes, higher well capacity, and applications needing greater dynamic range

SenS 1280 Software and SDK Options

Software choice depends on whether the camera is configured as a Compact or Smart version and which output interface is selected. Pembroke Instruments can help confirm the best software path for acquisition, triggering, camera control, and OEM integration.

InterfaceRecommended GUI / ToolSDK / Integration Notes
USB 3.0NITVisionUSB SDKs available for x86-64 and Arm64 using C++, C#, and Python
Camera Link - CompactNITVisionCamera Link workflow for industrial image acquisition and frame grabber integration
Camera Link - SmartNITGenicamControlToolGenICam-compatible Smart camera workflow with on-board processing features
CoaXPress - SmartNITGenicamControlToolHigh-performance machine vision integration using CxP and GenICam workflows
HD-SDI - SmartNITGenicamControlToolSmart configuration with HD-SDI output for compatible video and imaging systems
Integration note: Confirm camera version, output interface, cables, frame grabber needs, trigger wiring, and software/SDK requirements early in the project to avoid integration delays.

Common SenS 1280 Applications

SenS 1280 is especially useful when VGA-format SWIR cameras do not provide enough spatial detail, but a compact and practical camera form factor is still required.

Semiconductor Inspection

Inspect wafers, dies, packages, and silicon-based structures using SWIR wavelengths and higher SXGA image detail.

SWIR semiconductor applications ->

SWIR Microscopy

Use the 1.3 MP format for higher-resolution microscope imaging, optical alignment, and sample inspection.

SWIR microscope accessories ->

Security and Surveillance

Apply high-definition SWIR imaging to security, surveillance, and low-visibility imaging scenarios.

Discuss your requirement ->

Scientific Imaging

Support laboratory imaging, research, materials analysis, and specialized SWIR measurement tasks.

SWIR technical resources ->

Need Help Selecting or Integrating the SenS 1280?

Pembroke Instruments can help confirm the correct SWIR camera model, interface, lens, illumination, software, frame grabber, and integration approach for your application. Send your working distance, field of view, wavelength range, sample type, required frame rate, triggering needs, and software environment for a practical recommendation.

Camera Selection

Compare SenS 1280 against SenS 1920, SenS 640, HiPe SenS, and uncooled WiDy SWIR cameras.

Optics and Illumination

Match lenses, microscope adapters, filters, and SWIR illumination to the field of view and working distance.

Software Integration

Review NITVision, NITGenicamControlTool, SDK, triggering, and data acquisition options.