SenS 1920 SWIR Camera
2 megapixel InGaAs SWIR camera for high-resolution semiconductor inspection, material analysis, microscopy, and machine vision.
View SenS 1920 SWIR Camera ->SWIR cameras, also called shortwave infrared cameras or InGaAs cameras, capture image information beyond the visible spectrum. Pembroke Instruments supplies high-performance SWIR camera systems spanning approximately 450 to 3000 nm for semiconductor inspection, machine vision, laser beam profiling, spectroscopy, microscopy, material sorting, and scientific research.
Use this page to compare 2 megapixel SWIR cameras, 1.3 MP SWIR cameras, uncooled VGA SWIR cameras, TE-cooled VGA SWIR cameras, high-speed qVGA SWIR cameras, deeply cooled SWIR cameras, and line-scan SWIR cameras. For application examples, see the SWIR camera applications guide or contact Pembroke for camera, lens, illumination, and software selection support.
Pembroke Instruments helps engineers and researchers select the right SWIR camera by matching the sensor format, wavelength range, cooling level, data port type, optics, and software workflow to the actual measurement task. This layout is designed so users can quickly narrow the camera family before requesting a quote or technical review.
Choose 2 MP or 1.3 MP SWIR cameras for semiconductor inspection, microscopy, and spatially detailed machine vision.
View high-resolution cameras ->Choose TE-cooled or deeply cooled SWIR cameras for low-light imaging, spectroscopy-related work, and longer exposures.
View cooled cameras ->Choose qVGA or high-speed VGA SWIR cameras for dynamic processes, laser events, and fast inspection tasks.
View high-speed cameras ->Compare USB3, GigE Vision, Camera Link, CoaXPress, HD-SDI, and analog output options for your system architecture.
Talk to Pembroke ->Jump directly to the SWIR camera class that best matches your application. The tables below have been expanded to include the complete SWIR camera model list from the current Pembroke Instruments product spreadsheet.
Compare camera data port type, sensor format, cooling, wavelength range, and frame rate. Use these rows as a selection starting point; Pembroke Instruments can help verify optics, field of view, illumination, triggering, and software requirements.
| Camera Model | Image | Spectral Range | Data Port Type | Sensor Format | Cooling | Max Frame Rate | Best Fit |
|---|---|---|---|---|---|---|---|
| eZephir | ![]() |
900-2500 nm | USB 3.0 / Camera Link | 640 x 512 px / 15 µm | TE cooled | 240 fps | Extended SWIR, low-noise imaging, spectroscopy, astronomy, and demanding scientific applications |
| ALIZE | ![]() |
900-1700 nm | USB 3.0 / Camera Link | 640 x 512 px / 15 µm | TE cooled | 250 fps | Extended SWIR, low-noise imaging, spectroscopy, astronomy, and demanding scientific applications |
| Zephir 1.7 | ![]() |
900-1700 nm | USB 3.0 / Camera Link | 640 x 512 px / 15 µm | TE cooled | 240 fps | Extended SWIR, low-noise imaging, spectroscopy, astronomy, and demanding scientific applications |
Compare camera data port type, sensor format, cooling, wavelength range, and frame rate. Use these rows as a selection starting point; Pembroke Instruments can help verify optics, field of view, illumination, triggering, and software requirements.
| Camera Model | Image | Spectral Range | Data Port Type | Sensor Format | Cooling | Max Frame Rate | Best Fit |
|---|---|---|---|---|---|---|---|
| SenS 1920M-ST | ![]() |
900-1700 nm | Camera Link SDR26 | 1920 x 1080 px / 8 µm | TE cooled | 40 fps | High-resolution semiconductor inspection, microscopy, and detailed machine vision |
| SenS 1920L-ST | ![]() |
900-1700 nm | Camera Link-LSHM130 | 1920 x 1080 px / 8 µm | TE cooled | 40 fps | High-resolution semiconductor inspection, microscopy, and detailed machine vision |
| SenS 1920V-ST | ![]() |
900-1700 nm | USB 3.0 | 1920 x 1080 px / 8 µm | TE cooled | 40 fps | High-resolution semiconductor inspection, microscopy, and detailed machine vision |
Compare camera data port type, sensor format, cooling, wavelength range, and frame rate. Use these rows as a selection starting point; Pembroke Instruments can help verify optics, field of view, illumination, triggering, and software requirements.
| Camera Model | Image | Spectral Range | Data Port Type | Sensor Format | Cooling | Max Frame Rate | Best Fit |
|---|---|---|---|---|---|---|---|
| SenS 1280V-ST | ![]() |
900-1700 nm | USB 3.0 | 1280 x 1024 px / 10 µm | TE cooled | 60 fps | Balanced high-resolution SWIR imaging for industrial inspection, OEM integration, and research |
| SenS 1280M-ST | ![]() |
900-1700 nm | Camera Link SDR26 | 1280 x 1024 px / 10 µm | TE cooled | 60 fps | Balanced high-resolution SWIR imaging for industrial inspection, OEM integration, and research |
| SenS 1280M-STE | ![]() |
900-1700 nm | Camera Link SDR26 | 1280 x 1024 px / 10 µm | TE cooled | 60 fps | Balanced high-resolution SWIR imaging for industrial inspection, OEM integration, and research |
| SenS 1280C-STE | ![]() |
900-1700 nm | CoaXPress | 1280 x 1024 px / 10 µm | TE cooled | 60 fps | Balanced high-resolution SWIR imaging for industrial inspection, OEM integration, and research |
| SenS 1280H-STE | ![]() |
900-1700 nm | HD-SDI | 1280 x 1024 px / 10 µm | TE cooled | 60 fps | Balanced high-resolution SWIR imaging for industrial inspection, OEM integration, and research |
| SenS 1280L-STE | ![]() |
900-1700 nm | Camera Link-LSHM130 | 1280 x 1024 px / 10 µm | TE cooled | 60 fps | Balanced high-resolution SWIR imaging for industrial inspection, OEM integration, and research |
Compare TE-cooled VGA SWIR camera data port type, sensor format, cooling, wavelength range, and frame rate. These cooled SenS and HiPe SenS models are separated from uncooled cameras for clearer selection by sensitivity, cooling, and integration requirements.
| Camera Model | Image | Spectral Range | Data Port Type | Sensor Format | Cooling | Max Frame Rate | Best Fit |
|---|---|---|---|---|---|---|---|
| WiDy SenS 640V-ST | ![]() |
900-1700 nm | USB 3.0 | 640 x 512 px / 15 µm | TE cooled | 250 fps | VGA SWIR imaging for machine vision, research, industrial inspection, and OEM integration |
| WiDy SenS 640V-STP | ![]() |
900-1700 nm | USB 3.0 | 640 x 512 px / 15 µm | TE cooled | 250 fps | VGA SWIR imaging for machine vision, research, industrial inspection, and OEM integration |
| WiDy SenS 640M-ST | ![]() |
900-1700 nm | Camera Link SDR26 | 640 x 512 px / 15 µm | TE cooled | 250 fps | VGA SWIR imaging for machine vision, research, industrial inspection, and OEM integration |
| WiDy SenS 640L-ST | ![]() |
900-1700 nm | Camera Link-LSHM130 | 640 x 512 px / 15 µm | TE cooled | 250 fps | VGA SWIR imaging for machine vision, research, industrial inspection, and OEM integration |
| WiDy SenS 640M-STE | ![]() |
900-1700 nm | Camera Link SDR26 | 640 x 512 px / 15 µm | TE cooled | 250 fps | VGA SWIR imaging for machine vision, research, industrial inspection, and OEM integration |
| WiDy SenS 640M-STE2 | ![]() |
900-1700 nm | Camera Link SDR26 | 640 x 512 px / 15 µm | TE cooled | 250 fps | VGA SWIR imaging for machine vision, research, industrial inspection, and OEM integration |
| WiDy SenS 640L-STE2 | ![]() |
900-1700 nm | Camera Link-LSHM130 | 640 x 512 px / 15 µm | TE cooled | 250 fps | VGA SWIR imaging for machine vision, research, industrial inspection, and OEM integration |
| WiDy SenS 640M-STP | ![]() |
900-1700 nm | Camera Link SDR26 | 640 x 512 px / 15 µm | TE cooled | 250 fps | VGA SWIR imaging for machine vision, research, industrial inspection, and OEM integration |
| WiDy SenS 640M-STPE | ![]() |
900-1700 nm | Camera Link SDR26 | 640 x 512 px / 15 µm | TE cooled | 250 fps | VGA SWIR imaging for machine vision, research, industrial inspection, and OEM integration |
| WiDy SenS 640G-STE | ![]() |
900-1700 nm | GigE Vision / PoE | 640 x 512 px / 15 µm | TE cooled | 250 fps | VGA SWIR imaging for machine vision, research, industrial inspection, and OEM integration |
| WiDy SenS 640G-STE2 | ![]() |
900-1700 nm | GigE Vision / PoE | 640 x 512 px / 15 µm | TE cooled | 250 fps | VGA SWIR imaging for machine vision, research, industrial inspection, and OEM integration |
| WiDy SenS 640A-STE-PAL | ![]() |
900-1700 nm | Analog Video (PAL/NTSC) | 640 x 512 px / 15 µm | TE cooled | 60 fps | VGA SWIR imaging for machine vision, research, industrial inspection, and OEM integration |
| WiDy SenS 640A-STE-NTSC | ![]() |
900-1700 nm | Analog Video (PAL/NTSC) | 640 x 512 px / 15 µm | TE cooled | 60 fps | VGA SWIR imaging for machine vision, research, industrial inspection, and OEM integration |
| WiDy SenS 640H-STE | ![]() |
900-1700 nm | HD-SDI | 640 x 512 px / 15 µm | TE cooled | 250 fps | VGA SWIR imaging for machine vision, research, industrial inspection, and OEM integration |
| HiPe SenS 640V-ST | ![]() |
900-1800 nm | USB 3.0 | 640 x 512 px / 15 µm | TE cooled | 250 fps | VGA SWIR imaging for machine vision, research, industrial inspection, and OEM integration |
| HiPe SenS 640M-ST | ![]() |
900-1800 nm | Camera Link SDR26 | 640 x 512 px / 15 µm | TE cooled | 250 fps | VGA SWIR imaging for machine vision, research, industrial inspection, and OEM integration |
These uncooled VGA SWIR cameras are listed separately from the TE-cooled SenS models so visitors can quickly identify cost-effective, compact, and easy-to-integrate uncooled options for machine vision, industrial inspection, laboratory imaging, and OEM use.
| Camera Model | Image | Spectral Range | Data Port Type | Sensor Format | Cooling | Max Frame Rate | Best Fit |
|---|---|---|---|---|---|---|---|
| WiDy SWIR 640V-S | ![]() |
900-1700 nm | USB 3.0 | 640 x 512 px / 15 µm | Uncooled | 100 fps | VGA SWIR imaging for machine vision, research, industrial inspection, and OEM integration |
| WiDy SWIR 640G-SE | ![]() |
900-1700 nm | GigE Vision / PoE | 640 x 512 px / 15 µm | Uncooled | 100 fps | VGA SWIR imaging for machine vision, research, industrial inspection, and OEM integration |
| WiDy SWIR 640M-SE | ![]() |
900-1700 nm | Camera Link SDR26 | 640 x 512 px / 15 µm | Uncooled | 100 fps | VGA SWIR imaging for machine vision, research, industrial inspection, and OEM integration |
| WiDy SWIR 640A-SE-PAL | ![]() |
900-1700 nm | Analog Video (PAL/NTSC) | 640 x 512 px / 15 µm | Uncooled | 100 fps | VGA SWIR imaging for machine vision, research, industrial inspection, and OEM integration |
| WiDy SWIR 640A-SE-NTSC | ![]() |
900-1700 nm | Analog Video (PAL/NTSC) | 640 x 512 px / 15 µm | Uncooled | 100 fps | VGA SWIR imaging for machine vision, research, industrial inspection, and OEM integration |
Compare camera data port type, sensor format, cooling, wavelength range, and frame rate. Use these rows as a selection starting point; Pembroke Instruments can help verify optics, field of view, illumination, triggering, and software requirements.
| Camera Model | Image | Spectral Range | Data Port Type | Sensor Format | Cooling | Max Frame Rate | Best Fit |
|---|---|---|---|---|---|---|---|
| WiDy SenS 320V-ST | ![]() |
900-1700 nm | USB 3.0 | 320 x 256 px / 15 µm | TE cooled | 1,000 fps | High-speed qVGA SWIR imaging for dynamic events and compact integrations |
| WiDy SenS 320V-ST-HS | ![]() |
900-1700 nm | USB 3.0 | 320 x 256 px / 15 µm | TE cooled | 10,000 fps | High-speed qVGA SWIR imaging for dynamic events and compact integrations |
| WiDy SenS 320M-ST | ![]() |
900-1700 nm | Camera Link SDR26 | 320 x 256 px / 15 µm | TE cooled | 1,000 fps | High-speed qVGA SWIR imaging for dynamic events and compact integrations |
| WiDy SenS 320L-STE2 | ![]() |
900-1700 nm | Camera Link-LSHM130 | 320 x 256 px / 15 µm | TE cooled | 1,000 fps | High-speed qVGA SWIR imaging for dynamic events and compact integrations |
| WiDy SenS 320M-STE2 | ![]() |
900-1700 nm | Camera Link SDR26 | 320 x 256 px / 15 µm | TE cooled | 1,000 fps | High-speed qVGA SWIR imaging for dynamic events and compact integrations |
| WiDy SenS 320G-STE2 | ![]() |
900-1700 nm | GigE Vision / PoE | 320 x 256 px / 15 µm | TE cooled | 1,000 fps | High-speed qVGA SWIR imaging for dynamic events and compact integrations |
Compare camera data port type, sensor format, cooling, wavelength range, and frame rate. Use these rows as a selection starting point; Pembroke Instruments can help verify optics, field of view, illumination, triggering, and software requirements.
| Camera Model | Image | Spectral Range | Data Port Type | Sensor Format | Cooling | Max Frame Rate | Best Fit |
|---|---|---|---|---|---|---|---|
| LiSA | ![]() |
900-1700 nm | Camera Link SDR26 | 2048 x 1 px / 7.5 µm | TE cooled | 60 kHz | Line-scan SWIR inspection for continuous processes |
These representative SWIR camera families cover common engineering requirements from high-resolution InGaAs imaging to deeply cooled extended-SWIR measurements. Keep this section above or near the comparison table so visitors can quickly understand the major product families before reviewing detailed specifications.
2 megapixel InGaAs SWIR camera for high-resolution semiconductor inspection, material analysis, microscopy, and machine vision.
View SenS 1920 SWIR Camera ->
1.3 megapixel SWIR camera for industrial inspection, moisture detection, process monitoring, and research imaging.
View SenS 1280 SWIR Camera ->
VGA SWIR camera family with cooled and data-port-specific configurations for engineering and OEM integration.
View SenS 640 SWIR Camera ->
Deeply cooled extended-SWIR camera for low-light imaging, spectroscopy, astronomy, and scientific measurement.
View Zephir 2.5e SWIR Camera ->SWIR imaging is valuable when visible cameras cannot provide enough contrast, transmission, or wavelength-specific information. The dedicated applications page should carry the heavier application content, while this product page should summarize the most important uses and route visitors to deeper pages.
Inspect silicon wafers, dies, bonded devices, and packages using SWIR wavelengths that can reveal features invisible to visible cameras.
Learn more ->Image and align NIR/SWIR lasers used in research, manufacturing, medical systems, defense, and optical engineering.
Learn more ->Improve contrast for sorting, contamination detection, plastic inspection, coating checks, and industrial quality control.
Learn more ->Detect water content, wet/dry differences, coating variation, and material composition changes that standard cameras often miss.
Learn more ->Support microscopy, spectroscopy-related imaging, material science, photonics, low-light imaging, and laboratory experiments.
Learn more ->Move from broadband SWIR imaging to spectral imaging when material identification or chemical mapping is required.
Learn more ->Selecting and integrating a SWIR camera requires understanding detector physics, optical design, wavelength response, illumination, calibration, and image processing. Pembroke Instruments provides technical guides to help engineers and researchers evaluate InGaAs SWIR imaging systems and plan successful camera integrations.
Review how shortwave infrared light interacts with materials, why silicon becomes more transparent in SWIR wavelengths, and how InGaAs sensors capture information that visible cameras cannot see.
Explore practical SWIR imaging applications including semiconductor inspection, laser beam profiling, moisture detection, sorting, machine vision, scientific imaging, and materials analysis.
Learn about lens selection, SWIR coatings, working distance, field of view, illumination geometry, filters, and other optical design factors that affect SWIR camera performance.
Find guidance for camera integration, calibration workflow, triggering, software, image correction, and processing considerations for industrial and laboratory SWIR imaging systems.
These SWIR resources are intended to help define camera requirements, compare camera options, and support deployment in research, machine vision, semiconductor, laser, and industrial inspection applications.
Pembroke Instruments provides pre-sales and post-sales technical support for SWIR camera selection, lens matching, field-of-view planning, lighting, software, SDK integration, and system configuration. Share your wavelength range, field of view, working distance, target size, speed requirement, and data port type preference so we can recommend the best-fit SWIR imaging system.
Pembroke Instruments supplies NIR and SWIR camera systems with software options for live image viewing, camera setup, image acquisition, machine vision integration, scientific analysis, OEM development, and hyperspectral imaging workflows. The best software choice depends on the camera model, data port type, operating system, acquisition speed, triggering requirements, and whether the system is used for laboratory research, semiconductor inspection, microscopy, machine vision, or embedded OEM integration.
Vendor camera-control software provides a practical starting point for camera setup, live viewing, exposure control, gain control, triggering, image capture, and video recording. This is typically the fastest way to evaluate a SWIR camera and confirm image quality before moving into custom software or machine vision integration.
Many New Imaging Technologies (NIT) SWIR cameras, including SenS and WiDy camera families, are supported by NIT camera software and development tools. These tools are useful for both interactive camera operation and software integration in engineering, research, and OEM systems.
For custom software, OEM instruments, and automated inspection systems, SDKs provide direct access to camera control, image buffers, trigger events, and acquisition parameters. SDK-based integration is often preferred when the SWIR camera must operate inside a larger instrument, production system, or automated test platform.
GigE Vision and GenICam compatibility can simplify integration with third-party machine vision software and standardized camera-control environments. This is especially important for industrial systems that require long cable lengths, networked cameras, repeatable setup, and compatibility with existing machine vision tools.
Industrial SWIR inspection systems may use third-party machine vision platforms for measurement, defect detection, pattern recognition, sorting, robotics, or process control. Compatibility depends on the camera data port type, frame grabber, driver, and software environment.
For research, microscopy, spectroscopy-related imaging, and algorithm development, SWIR image data can often be exported for analysis in scientific software. TIFF image sequences and raw data workflows are commonly used when quantitative post-processing is required.
For most area-scan SWIR cameras, software selection begins with the vendor GUI for setup and image capture, then moves to SDK or third-party software when the camera must be integrated into a larger system. This approach works well for semiconductor inspection, laser beam profiling, microscopy, materials analysis, and machine vision.
SWIR hyperspectral imaging systems require additional software capabilities for spectral cube acquisition, wavelength calibration, reflectance correction, region-of-interest analysis, chemical mapping, and false-color visualization. These workflows are different from standard broadband SWIR camera acquisition.
Learn about SWIR hyperspectral imaging ->Need help selecting SWIR camera software? Pembroke Instruments can help match the camera, data port type, lens, illumination, software, SDK, and processing workflow to your application requirements.