High-Speed InGaAs SWIR Line-Scan Camera

LiSa SWIR Linescan Camera

LiSa is a high-speed InGaAs SWIR line-scan camera for continuous machine-vision inspection of moving materials. Its 2048 × 1 sensor, greater than 110 kHz full-resolution line rate, external triggering and Camera Link interface support semiconductor, photovoltaic, food, recycling, web and process-control applications.

LiSa Linescan SWIR Camera

LiSa Linescan SWIR Camera

2048 × 1InGaAs line sensor
0.9–1.7 µmSWIR response
>110 kHzFull-resolution line rate
Camera LinkIndustrial interface

Product Overview

Continuous SWIR Imaging at Production-Line Speeds

Unlike an area-scan camera, LiSa records one line of SWIR pixels at a time. As a conveyor, web, wafer or scanning stage moves the target, successive lines are assembled into a continuous 2-D image. This architecture is ideal for materials already moving through an industrial process.

The InGaAs detector operates across the standard SWIR region, where silicon, moisture, polymers, coatings and organic materials can show contrast that is weak or invisible to conventional visible cameras.

SWIR linescan application guide: Learn how line rate, conveyor speed, encoder synchronization, illumination, optics and material contrast work together.
Explore SWIR Linescan Imaging →

LiSa at a Glance

  • 2048 × 1 InGaAs sensor
  • 0.9–1.7 µm response
  • >80% QE
  • >110 kHz full-resolution line rate
  • 1 µs minimum integration time
  • ROI for higher rates
  • External / software / Camera Link triggering
  • GenICam / GenCP
  • C-mount

Applications

Where LiSa Adds Value

Semiconductor & Silicon

Inspect wafers and substrates for cracks, edge defects, inclusions and selected through-silicon features.

Semiconductor inspection →

Photovoltaic Inspection

Inspect silicon solar cells for cracks, process defects and non-uniformities during manufacturing.

Linescan application guide →

Food & Agriculture

Use SWIR contrast associated with moisture, drying, foreign material and composition on moving conveyors.

Machine vision →

Plastics & Recycling

Use wavelength-dependent material contrast for high-throughput sorting and recycling.

Material identification →

Moisture & Coatings

Inspect moisture variation, coatings, adhesives and sealants continuously across moving materials.

Web & Roll Inspection

Inspect paper, film, textiles, foil, battery materials and other continuous webs across their full width.

Why Choose LiSa?

Designed for High-Speed SWIR Machine Vision

High Line Rate

Full-resolution operation above 110 kHz supports fast conveyors, webs and scanning stages. Reduced ROI can increase acquisition rate further.

Flexible Triggering

Internal, external LVTTL, software and Camera Link triggering support synchronization with encoders, PLCs and illumination.

Industrial Integration

Camera Link Base output, GenICam / GenCP control and selectable pixel formats support machine-vision integration.

Technical Data

LiSa Technical Specifications

SpecificationLiSa
Sensor / materialNSC2301 / InGaAs
Resolution2048 × 1
Pixel size8 × 14 µm | 8 × 200 µm
Spectral response0.9 to 1.7 µm
Response / modesLinear, Low/Medium/High Gain; ITR, IWR, ROI
QE>80%
Full-resolution line rate>110 kHz
Minimum integration1 µs; camera register or trigger-width control
TriggerInternal / External (LVTTL), Software, Camera Link
ROIUser-selectable in 8-pixel steps; reduced ROI increases maximum rate
Read-out noiseHigh gain (CDS): <90 e−; Medium: <370 e−; Low: <2200 e−
Dynamic rangeHigh: 55 dB typical; Medium: 62 dB; Low: 66 dB
ControlGenICam / GenCP
OutputCamera Link Base; 8 / 10 / 12 / 14-bit formats
Camera power<4 W
TEC coolingOff; Low <1 W; Medium <2 W; High <5 W
Operating temperature−40 to +71 °C
Dimensions / weight45.4 × 75 × 58 mm / 280 g
Lens mountC-Mount
SoftwareNITGenicamControlTool — Windows, camera control only

System Design

Define the Complete Inspection Requirement

Inspection Width

Specify field of view across the target.

Smallest Feature

Define the smallest defect that must be detected.

Line Speed

Provide conveyor speed and desired sampling.

Wavelength & Lighting

Select reflective, transmitted, backlight or wavelength-specific illumination.

Mechanical Geometry

Confirm working distance, focal length and available space.

Interface & Software

Define frame grabber, trigger, GenICam, processing and PLC requirements.

Video

See SWIR Linescan Imaging in Action

Application Engineering & Pricing

Need Help Configuring a LiSa Linescan System?

Send the material, inspection width, smallest defect, conveyor speed, working distance, wavelength requirements, interface and software environment. Pembroke Instruments can help match the camera, lens, illumination, triggering and processing approach to the application.

SWIR Imaging Request

SWIR Imaging Request

Send in your requests for informaation

Please describe your application and if you need pricing and/or technical information