Compact UV-VIS-NIR Spectrometers for Scientific, Industrial, and OEM Applications
Compact spectrometers are widely used in scientific research, industrial process monitoring, and OEM integration where accurate, real-time spectral measurement is required. Pembroke Instruments provides compact UV-VIS-NIR spectrometers as individual instruments and as fully integrated spectroscopy solutions that can include matched light sources, sample cells, cuvette holders, fiber optics, and optical probes for absorbance, transmission, and reflectance measurements.
These spectrometer systems are ideal for chemical analysis, material identification, process control, reflectance, transmission, absorbance, emission, and portable instrumentation. Engineers can select an ARIS, SIENA, or NYLIS spectrometer and pair it with compatible spectroscopy accessories to create a complete measurement setup for laboratory, industrial, or OEM use.
Avenir Compact Spectrometer Models
Use the three product families below to match wavelength range, sensitivity, resolution, and integration requirements to your measurement task.
ARIS UV-VIS Spectrometer
ARIS compact UV-VIS spectrometers deliver laboratory-grade performance in a format suited for portable instruments, OEM integration, and industrial spectroscopy.
- Wavelength configurations from 185 to 1100 nm
- High-throughput Czerny-Turner optical design
- Low stray light for absorbance and process monitoring
SIENA NIR Spectrometer
SIENA NIR compact spectrometers extend affordable near infrared measurement into the 800-2100 nm range using an uncooled InGaAs sensor.
- NIR wavelength ranges up to 2100 nm
- Uncooled InGaAs detector
- Useful for materials, moisture, composition, and process sensing
NYLIS High-Resolution Spectrometer
NYLIS high-resolution compact spectrometers are designed for applications that require fine spectral detail in a small footprint.
- Resolution down to 0.06 nm FWHM
- 4096-pixel CMOS detector
- Strong fit for laser measurement and precision spectral analysis
Compact Spectrometer Selection Guide
Need UV-VIS?
Choose ARIS for UV, visible, and VIS-NIR work where high sensitivity, low stray light, and compact integration are important.
ARIS tables →Need NIR?
Choose SIENA for near-infrared spectroscopy up to 2100 nm, including material, food, moisture, and process applications.
SIENA tables →Need High Resolution?
Choose NYLIS when narrow spectral features, laser lines, or detailed spectral structure are central to the measurement.
NYLIS tables →Need Integration?
Review interface, software, trigger, optical input, slit, and OEM customization requirements before final selection.
Talk to Pembroke →Product Tables and Technical Specifications
The tables below keep the key product data visible on the page so engineers can quickly compare wavelength range, resolution, optics, and detector options before requesting a quote or technical review.
ARIS Wavelength Range and Resolution
| Configuration | Wavelength Range | Resolution (FWHM) Typ. | Resolution (FWHM) Max. |
|---|---|---|---|
| ARIS Wide | 185 - 1000 nm | 1.00 nm | 1.20 nm |
| ARIS UV/VIS | 185 - 550 nm | 0.40 nm | 0.60 nm |
| ARIS UV | 185 - 420 nm | 0.33 nm | 0.40 nm |
| ARIS VIS | 350 - 840 nm | 0.60 nm | 0.70 nm |
| ARIS VIS/NIR | 510 - 1020 nm | 0.80 nm | 1.00 nm |
| ARIS Wide NIR | 300 - 1100 nm | 1.10 nm | 1.40 nm |
Values based on the standard ARIS wavelength-range table.
SIENA Wavelength Range and Resolution
| Configuration | Wavelength Range | Resolution (FWHM) Typ. | Resolution (FWHM) Max. |
|---|---|---|---|
| Siena 1.7 | 940 - 1700 nm | 8 nm | 10 nm |
| Siena 1.9 | 800 - 1900 nm | 12 nm | 14 nm |
| Siena 2.1 | 900 - 2100 nm | 13 nm | 16 nm |
Values based on the standard SIENA wavelength-range table.
NYLIS Wavelength Range and Resolution
| Wavelength Range | Resolution (FWHM) Typ. | Resolution (FWHM) Max. |
|---|---|---|
| 380 - 750 nm | 0.19 nm | 0.23 nm |
| 750 - 1100 nm | 0.20 nm | 0.24 nm |
| 380 - 540 nm | 0.09 nm | 0.11 nm |
| 470 - 630 nm | 0.09 nm | 0.11 nm |
| 580 - 740 nm | 0.09 nm | 0.11 nm |
| 400 - 500 nm | 0.06 nm | 0.07 nm |
| 500 - 600 nm | 0.06 nm | 0.07 nm |
| 620 - 700 nm | 0.06 nm | 0.07 nm |
| 740 - 810 nm | 0.06 nm | 0.07 nm |
| 800 - 860 nm | 0.06 nm | 0.07 nm |
Values based on the standard NYLIS wavelength-range table.
Optical Design Comparison
| Parameter | ARIS | SIENA | NYLIS |
|---|---|---|---|
| Optical design | Symmetrical high-throughput Czerny-Turner | Symmetrical high-throughput Czerny-Turner | Symmetrical Czerny-Turner |
| Focal length | 50 mm | 30 mm | 120 mm |
| Numerical aperture | 0.16 equivalent area | 0.19 equivalent area | 0.07 equivalent area |
| Stray light | 0.08% | 0.08%* | 0.3% |
| Detector lens | Included | Included | Included |
| Order sorting filter | Included if required | Included if required | Included if required |
| Optical interface | SMA connector; other interfaces on request | SMA connector; other interfaces on request | SMA connector; other interfaces on request |
* SIENA stray light value measured with halogen lamp and long-pass filter.
Detector and Image Sensor Comparison
| Parameter | ARIS Toshiba TCD1304 | ARIS Hamamatsu S11639-01 | ARIS Hamamatsu S13496 | SIENA InGaAs | NYLIS Hamamatsu S13496 |
|---|---|---|---|---|---|
| Sensor type | CCD | CMOS | CMOS | InGaAs | CMOS |
| Number of pixels | 3648 | 2048 | 4096 | 256 | 4096 |
| Exposure times | 3 microseconds - 35 min | 54 microseconds - 35 min | 54 microseconds - 35 min | 4 microseconds - 10 min | 54 microseconds - 35 min |
| SNR* | 350 | 600 | 550 | 1000 | 550 |
| Dynamic range** | 1900:1 | 6000:1 | 5500:1 | 12000:1 | 5500:1 |
| Readout noise*** | 35 counts | 11 counts | 11 counts | 4 counts RMS | 11 counts |
| Trigger jitter | ≤ 1 exposure time | ≤ 1 microsecond | ≤ 1 microsecond | ≤ 1 microsecond | ≤ 1 microsecond |
* Maximum signal-to-noise ratio without averaging. ** Without averaging, for a single pixel. *** Typical RMS value for a single exposure, scaled to 16 bit.
Compact Spectrometer Capabilities
Broad UV-VIS-NIR Coverage
Configure systems for ultraviolet, visible, VIS-NIR, and near-infrared spectral ranges from 185 nm through 2100 nm depending on model and configuration.
Laboratory Performance in a Small Format
Compact optical design, high sensitivity, and low stray light enable accurate spectral measurements in benchtop, portable, and embedded systems.
OEM and Industrial Integration
USB interface, triggering options, optical inputs, replaceable slit options, and SDK/software support help move from laboratory evaluation to production integration.
Applications for Compact UV-VIS and NIR Spectrometers
Compact spectrometers from Pembroke Instruments provide high-performance spectral measurement solutions for laboratory research, industrial integration, process monitoring, portable instrumentation, and OEM sensing.
UV-VIS Spectroscopy Applications - ARIS
The ARIS compact spectrometer delivers laboratory-grade UV-VIS performance in a compact, integration-ready design.
- Absorbance and transmission measurements
- Chemical concentration analysis
- Biotechnology and life science assays
- Thin film and coating analysis
- Optical component characterization
- Water quality monitoring
- Industrial color measurement
NIR Spectroscopy Applications - SIENA
The SIENA compact NIR spectrometer enables practical near-infrared analysis in portable, embedded, and industrial systems.
- Material identification and sorting
- Moisture and composition analysis
- Food and agricultural inspection
- Process analytics
- Polymer and organic material analysis
- Portable spectroscopy systems
- Inline manufacturing inspection
Optimized for Real-World Integration
Pembroke Instruments provides expert pre-sales and post-sales support to ensure optimal spectrometer selection, integration, calibration, and long-term performance.
Discuss your compact spectrometer application →Compatible Light Sources and Optical Probes for ARIS and SIENA Compact Spectrometers
ARIS and SIENA compact spectrometers can be configured with compatible light sources and optical probes for absorbance, transmission, and reflectance spectroscopy measurements across the UV, visible, near-infrared, and SWIR spectral regions.
UV-VIS Light Source
Absorbance / Transmission Probe
Reflectance Probe
| Spectrometer Model | Wavelength Range | Recommended Light Source | Absorbance / Transmission Probe | Reflectance Probe | Typical Applications |
|---|---|---|---|---|---|
| ARIS Wide | 185-1000 nm | UV-VIS-NIR deuterium / halogen combined source | UV-VIS-NIR absorbance dip probe | UV-VIS-NIR reflectance probe | Broadband spectroscopy and research applications |
| ARIS UV/VIS | 185-550 nm | UV-VIS deuterium / tungsten halogen source | UV-VIS absorbance probe | UV-VIS reflectance probe | UV chemistry, coatings, fluorescence, process monitoring |
| ARIS UV | 185-420 nm | Deuterium UV source | UV absorbance probe | UV reflectance probe | Deep UV absorbance and semiconductor measurements |
| ARIS VIS | 350-840 nm | Tungsten halogen VIS source | VIS absorbance probe | VIS reflectance probe | Color measurement and visible spectroscopy |
| ARIS VIS/NIR | 510-1020 nm | VIS-NIR tungsten halogen source | VIS-NIR absorbance probe | VIS-NIR reflectance probe | Agriculture, plastics, food inspection |
| ARIS Wide NIR | 300-1100 nm | Broadband UV-VIS-NIR source | UV-VIS-NIR absorbance probe | UV-VIS-NIR reflectance probe | OEM spectroscopy and broadband analysis |
| SIENA 1.7 | 940-1700 nm | NIR / SWIR tungsten halogen source | NIR absorbance probe | NIR reflectance probe | Moisture, food, agriculture, pharmaceutical analysis |
| SIENA 1.9 | 800-1900 nm | Extended NIR halogen source | Extended NIR absorbance probe | Extended NIR reflectance probe | Chemical composition and process spectroscopy |
| SIENA 2.1 | 900-2100 nm | Broadband SWIR tungsten halogen source | SWIR absorbance probe | SWIR reflectance probe | SWIR material analysis and plastics sorting |
Selection Guidance
ARIS spectrometers are typically paired with UV-VIS or UV-VIS-NIR light sources and silica fiber probes. Deuterium lamps are recommended for UV measurements below approximately 400 nm, while tungsten halogen sources are commonly used for visible and NIR spectroscopy.
SIENA spectrometers are optimized for NIR and SWIR spectroscopy and are typically paired with stabilized tungsten halogen or quartz tungsten halogen light sources along with low-OH or IR optical fibers.
Spectroscopy Resources and Related Product Pages
Use these links to move from compact spectrometer selection into broader spectroscopy applications, high-performance spectrometers, and application guidance.
Spectroscopy Applications
Review common UV-VIS, NIR, high-energy, laboratory, and industrial spectroscopy use cases.
View spectroscopy applications →High-Performance Spectrometers
Explore VUV, XUV, X-ray, and advanced spectrometer systems for demanding research applications.
View spectrometers →Application Support
Get help matching wavelength range, spectral resolution, optical input, detector, and software workflow to your measurement.
Contact Pembroke →Need Help Selecting a Compact Spectrometer?
Tell Pembroke Instruments about your wavelength range, sample type, measurement geometry, light source, required resolution, integration environment, and software needs. We can help compare ARIS, SIENA, NYLIS, and other spectroscopy options for your application.