Our product portfolio includes integrated XAS systems both for near and extended energy regions of an absorption edge.
The NEXAFS region close to the absorption edge shows the largest variations in the x-ray absorption coefficient and is often dominated by intense, narrow resonances caused by the transition of core electrons to non-bound levels. NEXAFS is sensitive to local atomic states such as oxidation states.
The EXAFS structure is formed by the wave-like nature of the emitted photoelectron, which is scattered by surrounding atoms and forms oscillations from constructive and destructive interference that can then be used to infer bond lengths and information on neighboring atoms.
Turn-key system for NEXAFS spectroscopy in the 200-1200eV range. Measurements with a quality on par with synchrotron results allow chemical state analysis in the lab. No need to apply for beamtime to gain insight into the electronic configuration of elements, including oxidation state, bond lengths, and molecule orientation
Integrated NEXAFS system
first integrated table-top NEXAFS spectroscopy solution
no need to apply and wait for beamtime
chemical state analysis for geology, biology, materials research
fast polychromatic acquisition
Synchrotron-quality spectra
energy range 200 to 1200eV
high resolving power of 1900
extremely high surface sensitivity
information on molecular orbitals, oxidation state, coordination number
software suite for spectra analysis
Applications
analysis of organic materials, e.g. lipid membranes, humicacids, polymer films, especially at carbon K-absorption edge
surface-sensitive chemical analysis of C, N, O, Ca, K, Ti