Description
The intuitive, yet versatile X-ray spectrographs for the tender and hard X-ray range feature high-resolution XRF measurements in the 1-12keV energy range.
A variety of table-top sized geometries can be selected for optimum performance with energy resolution 0.5-1.5eV. Crystal choices include flat-, 1D- and 2D-bent crystals, including diced / segmented.
Monte Carlo simulations can be provided to find the optimal spectrometer configuration and geometry. The calculations consider any type and distribution of source, any configuration and distances, and 0D- 1D- and 2D detectors. The resulting detector image and X-ray spectrum gives a direct estimate of energy resolution and efficiency of the spectrometer.
Main Features
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x-ray spectrograph in von Hamos, Johann,
or Johansson geometry -
crystal choices: flat-, 1D- and 2D-bent, including diced / segmented
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Bragg angles 50 to 80°
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energy range 1 – 12 keV
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energy resolution 0.5 – 1.5 eV
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operating pressure <10^-6 mbar vacuum
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modular, adaptable design
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turn-key, hassle-free operation
We offer specialized solutions for almost every application, including:
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non-magnetic instruments
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special housing geometries, in-chamber solutions
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adapted motion axes:
Bragg, gap, roll, pitch with closed-loop feedback -
Monte Carlo simulations for performance studies
Light Detection Options
Our spectrometers can be operated with all state-of-the-art detection systems:
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x-ray CCD cameras for highest resolution, large dynamic range and absolute signal strength
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large-area MCPs for broadest wavelength coverage and gated / intensified detection
Visit our product webpage for compatible ALEX series CCD cameras for x-ray spectroscopy.
Applications
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resonant inelastic X-ray scattering (RIXS), X-ray emission spectroscopy (XES) or X-ray Raman scattering (XRS) studies
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high intensity laser-matter interaction
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high-resolution shot-to-shot characterization of undulator and free-electron-laser (FEL) radiation
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magnetically confined plasmas
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line characterization in fusion research