Thermal Imaging Microscopes for Electronics, Semiconductor & Materials Analysis
Pembroke Instruments supplies integrated thermal microscope systems for non-contact temperature mapping, PCB failure analysis, semiconductor device testing, solar cell inspection, and advanced materials research.
See Heat Patterns That Conventional Microscopes Miss
Thermal imaging microscopy is an established method for rapidly identifying defects and abnormal heat generation in solar panels, semiconductors, PCB assemblies, and electronic devices. Instead of relying on visual contrast, the microscope maps temperature distribution across the sample so engineers can locate hot spots, leakage paths, short circuits, and localized heating.
Measure without disturbing the device
Thermal microscopy provides remote temperature mapping without probes contacting the test area, helping preserve delicate electronics, wafers, coatings, and materials.
Temperature data, not just images
Full radiometric video supports temperature curves, comparison over time, and quantitative analysis for engineering reports and process troubleshooting.
Camera, optics, mount, stage & software
Pembroke can configure the complete solution, including the thermal camera, microscope optics, vertical mounting, sample translation stage, and software.
Thermal Microscope Applications
Use thermal microscopy wherever microscopic temperature differences reveal performance problems, manufacturing defects, or failure mechanisms.
PCB & Electronics Testing
Locate overheating components, shorts, high-resistance connections, and power dissipation problems across circuit boards.
Semiconductor Failure Analysis
Identify localized heating, leakage current, packaging issues, and thermal behavior in ICs and semiconductor devices.
Solar Cell Inspection
Find defective cells, hot spots, cracks, shunts, and non-uniform heating in photovoltaic materials and modules.
Battery & Power Electronics
Analyze heat generation in energy storage components, power devices, connectors, and thermal management structures.
Materials Research
Measure thermal behavior of coatings, films, composites, microstructures, and phase-change materials.
Photonics & Laser Testing
Evaluate absorption-induced heating, optoelectronic components, laser-exposed materials, and package-level thermal effects.
Configured Around Your Sample, Field of View & Resolution Requirements
Pembroke Instruments can configure a complete thermal microscope solution using a VGA LWIR thermal camera, microscope objective or macro lens, vertical mount, optical breadboard, and translation stage. The platform can also be adapted to your existing stage or lab setup.
- Thermal camera with 640 × 512 LWIR sensor
- 50 mm macro lens included in standard configuration
- Objective lens options for different fields of view and working distances
- Vertical mounting and sample translation stage
- Standard optical breadboard for modular expansion
- Software for radiometric video, temperature curves, voltage, and current synchronization
Thermal Microscope System Highlights
| Parameter | Typical Configuration / Capability |
|---|---|
| Detector type | LWIR thermal imaging camera configured for microscopy |
| Sensor format | 640 × 512 pixels for high-definition thermal imaging |
| Spatial resolution | Approximately 20 µm when imaging IC/PCB boards, depending on optics, working distance, and setup |
| Lens / optics | Includes 50 mm macro lens; objective options available for application-specific magnification and field of view |
| Temperature range | -20°C to +550°C |
| Video and data | Full radiometric video with temperature data |
| Synchronized measurements | Software can synchronize temperature curves, voltage, and current over time |
| Mechanical platform | Vertical microscope mounting, sample translation stage, and optical breadboard configuration |
Final configuration depends on sample size, required spatial resolution, field of view, working distance, and measurement temperature range.
Thermal Resolution for PCB and IC-Level Analysis
The system can be used to image calibrated targets and fine thermal features for practical electronics and semiconductor analysis. For PCB and IC work, this helps identify heat patterns across traces, packages, pads, components, and localized defect regions.
- Visualize small heat sources that are difficult to find with contact probes
- Compare hot spots across operating conditions
- Measure thermal behavior while voltage and current are monitored
- Support failure analysis and R&D troubleshooting workflows
Send us your sample size, target feature size, and working distance →
How Pembroke Helps Configure the Right Thermal Microscope
1. Define the Sample
We review sample size, target features, temperature range, working distance, and whether the system must integrate with an existing stage or test setup.
2. Select Camera & Optics
We match the LWIR camera, macro lens or microscope optics, field of view, and spatial resolution to the application requirements.
3. Configure the Platform
We provide the vertical mount, breadboard, stage, and software configuration needed for repeatable, quantitative thermal measurement.
Need a Thermal Microscope for a Specific Sample or Test Setup?
Send Pembroke Instruments your sample size, desired field of view, target feature size, temperature range, and whether you need synchronized electrical measurements. We can recommend a complete configuration.