Applications: Semiconductor and Electronics

SWIR Cameras     SWIR Microscopes     Thermal Microscopes

SWIR Cameras and Microscopes

Added Value for Application

SWIR cameras and microscopes deliver three things no other imaging technology can combine:

1. See through silicon

2. See electrically active failures

3. See inside packaged devices without destruction

That’s why they are indispensable in:

• Semiconductor fabs

• Failure analysis labs

• Advanced packaging lines

• R&D and reliability engineerin

Thermal Microscopes

Added Value for Application

Thermal microscopes add exceptional value to printed circuit board (PCB) defect detection because they reveal electrical, thermal, and material failures that are completely invisible to visible-light inspection, AOI, or X-ray. They allow you to see how electricity and heat are actually behaving at the micro-scale, not just how the PCB looks structurally.

✅ Defects Detected Instantly by Thermal Imaging:

• Short circuits

• Leakage paths

• Latch-up events

• ESD damage

• Gate oxide breakdown

• Via micro-shorts

• Delaminated copper traces

These faults may look perfect under a visible microscope, but under power they generate localized micro-hotspots (often <20 µm) that thermal microscopy detects immediately