Our H+P spectrometer platform includes many configurations spanning the X-Ray, XUV, EUV, and VUV regions. Many standard configurations are available and we also can quote customized spectrometers.
Spectrometer Model Table
Featured Spectrometers
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High-efficiency flat-field XUV spectrometer and beamprofiler. Maximum light collection and highest system efficiency. Available in an XUV spectrometer. The integrated beam profiler makes it a complete characterization tool for any XUV source. Wide flat-field coverage in 1-200nm and automated switching.
The spectrometer table below provides a quick comparison of key performance features and a link to the complete data sheet.
| Spectrometer Platform | Product Image | Description | Spectral Range | Data Sheet Link |
| easy-LIGHT-VUV |  | easyLIGHT VUV compact VUV spectrometer Versatile spectrometer covering 80-300nm spectral range with optional monochromator mode. Best-in-class grating efficiency. Closed-loop grating positioning provides excellent wavelength accuracy. Integrated stray light suppression. | 80-300 nm | easyLIGHT-VUV |
| max-LIGHT-VUV |  | maxLIGHT pro VUV high-efficiency flat-field VUV spectrometer and beamprofiler A complete characterization tool for any VUV source, combining a high-efficiency spectrometer for 40-200nm and a beamprofiler. Automated switching of spectral region and plug-and-play extension options to shorter XUV wavelengths give increased flexibility in the lab. compact VUV spectrometer Versatile spectrometer covering 80-300nm spectral range with optional monochromator mode. Best-in-class grating efficiency. Closed-loop grating positioning provides excellent wavelength accuracy. Integrated stray light suppression. | 1-200 nm | maxLIGHT-pro-VUV-XUV |
| maxLIGHT-pro-XUV |  | maxLIGHT pro high-efficiency flat-field XUV spectrometer and beamprofiler Maximum light collection and highest system efficiency available in an XUV spectrometer. The integrated beamprofiler makes it a complete characterization tool for any XUV source. Wide flat-field coverage in 1-200nm and automated switching of spectral region increase lab efficiency substantially | 1-200 nm | maxLIGHT-pro-VUV-XUV |
| easy-LIGHT-XUV |  | easyLIGHT XUV compact high-efficiency flat-field XUV spectrometer Flat-field spectral coverage of 30-250nm in no-slit configuration for up to 20-times higher efficiency. Compact device covering a broadband spectral range. Integrated stray light suppression for increased signal-to-noise. | 30-250 nm | easyLIGHT-XUV |
| highLIGHT-XUV |  | highLIGHT high-resolution flat-field XUV spectrometer Highest spectral resolution available in a flat-field XUV spectrometer. Wide spectral bandwidth of 1-20nm, resp. 5-100nm. Two modes of operation: high-efficiency no-slit and conventional entrance slit mode. | 1-100 nm | hiLIGHT-XUV |
| easy-LIGHT-MONO |  | easyLIGHT VUV compact VUV monochromator and spectrometer Easy-to-use monochromator for 80-300nm spectral range. Excellent wavelength accuracy by closed-loop positioner. Best-in-class efficiency. Slit control manually or motorized. Compact and flexible footprint. | ON REQUEST | |
| mono-LIGHT |  | monoLIGHT toroidal grating monochromator Monochromator for laboratory VUV sources. Toroidal grating with high efficiency. Standard version for He spectral lines. Highly stable and compact footprint. Manual and motorized versions. | ON REQUEST | |
| XAS |  | Our product portfolio includes integrated XAS systems both for near and extended energy regions of an absorption edge. The NEXAFS region close to the absorption edge shows the largest variations in the x-ray absorption coefficient and is often dominated by intense, narrow resonances caused by the transition of core electrons to non-bound levels. NEXAFS is sensitive to local atomic states such as oxidation states. | 200-1200eV / 1-6nm | XAS-X-Ray Spectroscopy |
Our maxLIGHT pro offers the high-performance spectrometer functionality of the maxLIGHT combined with a straightforward beam profiler. Automated and quick switching between spectrograph and profiler modes allows for routine verification of beam properties.
The spectrograph features aberration-corrected flat-field wavelength coverage from 1nm to 200nm. Wide-band spectral measurements are possible by three gratings covering 1-20nm, 5-80nm, and 40-200nm. The spectrometer can be used without entrance slit to maximize light collection for a range of source distances.
Our easyLIGHT XUV spectrograph provides aberration-corrected wavelength coverage in the extreme and vacuum ultraviolet spectral region. Based on a normal-incidence geometry, the high-efficiency flat-field grating provides wide-band spectral measurements covering 30 to 200nm. The spectrometer can be used without entrance slit to maximize light collection for a range of source distances.
Our easyLIGHT spectrograph provides aberration-corrected wavelength coverage in the vacuum ultraviolet spectral region. Based on a normal-incidence geometry, it offers spectrograph and monochromator functionality. The high-efficiency gratings can be rotated about their apexes by a high-accuracy positioning system, resulting in a wavelength selection accuracy at the exit slit of <0.1 nm. Entrance and exit slit widths can be set in the range of 0.01 to 4 mm by micrometer screws or a motorized actuator (optional).
Our product portfolio includes integrated XAS systems both for near and extended energy regions of an absorption edge.The NEXAFS region close to the absorption edge shows the largest variations in the x-ray absorption coefficient and is often dominated by intense, narrow resonances caused by the transition of core electrons to non-bound levels. NEXAFS is sensitive to local atomic states such as oxidation states.
This application maps to the ALEX series with back-illuminated CCD sensors.
This application maps to the ALEX or LOTTE series.
This application maps to the ALEX or LOTTE series.
Access LEED technical discussion for more information.
