UV-VIS and NIR Cameras designed by scientists for scientists.
The Greateyes series of scientific CCD cameras for UV-VIS and NIR imaging is designed for applications that demand top level performance for both imaging and spectroscopy applications. Sixteen configurations are available spanning 200 to 1100 nm with USB3 or GigE data ports. Drivers are available so you can run the cameras within Matlab or Labview.
+Models optimized out to 1050 nm +All cameras use ultra low noise scientific grade back-illuminated CCD’s +Formats include 1024X1024, 1024X256; Flexible binning +Pixel size as small as 13um X13 um + Dynamic range up to 18 bits + GUI, SDK included; Labview drivers +Deep cooling down to -60C +USB or GigE + Labview and Linux integration
+Select model optimized within 200-1100 nm +All cameras use ultra low noise scientific grade back-illuminated CCD’s +Formats include 1024X1024, 1024X256; 1024X128, 2048X512 Flexible binning +Pixel size as small as 6.9X6.9 um + Dynamic range up to 18 bits + GUI, SDK included; Labview drivers +Deep cooling down to -60C +USB or GigE + Labview and Linux integration
Fluorescence in vivo imaging works on the basis of fluorochromes that are excited by an external light source, and which emit light of a different wavelength in response. The emitted fluorescence can be detected by using a camera which is sensitive in the spectral range of near-infrared.
Laser Plasma Source for X-Ray Spectroscopy
A leading university is developing a modular Laser-Plasma Source for Spectroscopy emitting Soft X-Ray radiation. This source will allow experiments on laboratory scale that were previously only possible with synchrotron radiation sources. For full characterisation of the soft X-Ray source (100-1300 eV) it is necessary to measure the emission spectra as well as the properties of radiation beam. Our camera model GE 2048 512 BI has been employed for both purposes. It was used as a detector in combination with a transmission grating spectrometer and for direct imaging of the beam utilizing a pin hole.
EUV transmission spectroscopy
The method of EUV transmission spectroscopy provides a fast thickness characterization for thin foils and is based on a laser induced plasma source which emits light in the EUV
The solar cell or wafer is excited by an intensive light source. No electrical connections to the solar cell are necessary. The invisible photoluminescence radiation emitted by the wafer or solar cell is detected by a highly sensitive camera.